Latest Development of MnSi1.7 Semiconducting Films

Wei Zhao,Qingrun Hou,Yibao Chen,Yuanjin He
DOI: https://doi.org/10.13922/j.cnki.cjovst.2008.06.019
2008-01-01
Abstract:The latest progress in the growth technologies and properties characterization of the MnSi1.7 semi-conducting films was reviewed.MnSi1.7 semiconducting film could be a promising material in fabricating optical devices,including infrared detectors,miniaturized thermo-electric generators etc.Discussions focused on the technical advantages of the infrared detectors made of MnSi1.7 semi-conducting films over those of the conventional ones,such as the PtSi and Bi1-xSbx detectors.The technologies of impurity doping and of nanostructures fabrication were also discussed.The p-type and n-type MnSi1.7 films with low resistivity can be obtained by doping of different impurities.Besides,after the films thinned to 14nm,the Seebeck coefficient reaches-967μV·K-1 at a temperature of 483K.
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