Enhancement Of Thermoelectric Power Factor Of Mnsi1.7 Films By Si Addition And Modulation Doping

Q. R. Hou,B. F. Gu,Y. B. Chen,Y. J. He
DOI: https://doi.org/10.1002/pssa.201127753
2012-01-01
Abstract:Silicon-added and modulation-doped higher manganese silicide (HMS, MnSi1.7) films have been prepared on glass substrates by magnetron-sputtering of MnSi1.85, Si, and Al targets. Silicon-addition and modulation-doping are used to enhance the Seebeck coefficient and reduce the electrical resistivity, respectively. Raman spectra indicate that the silicon-added MnSi1.7 film consists of two phases, crystalline MnSi1.7 and crystalline silicon. It is found that the silicon-added MnSi1.7 film has a larger Seebeck coefficient (S), but a higher electrical resistivity (?) as well. Consequently, the thermoelectric power factor (PF?=?S2/?) is not enhanced, 0.320 x 10-3?W/m?K2 at 733?K, and about the same as that of a pure MnSi1.7 film. The silicon-added MnSi1.7 layer in a modulation-doped structure Si:Al/MnSi1.7/glass, however, has a higher energy barrier height, a larger Seebeck coefficient, and a lower electrical resistivity. As a result, the thermoelectric power factor is greatly enhanced and can reach 0.573 x 10-3?W/m?K2 at 733?K.
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