Enhancement of the Thermoelectric Power Factor of MnSi 1.7 Film by Modulation Doping of Al and Cu

Q. R. Hou,B. F. Gu,Y. B. Chen,Y. J. He,J. L. Sun
DOI: https://doi.org/10.1007/s00339-013-7794-0
2013-01-01
Abstract:It is well known that aluminum (Al) and copper (Cu) are acceptor impurities with shallow- and deep-energy levels in silicon (Si), respectively. The thermoelectric power factor of Al and Cu codoped Si film is larger than that of only Al-doped Si film. In this report, the Al and Cu codoped Si layer, Si: (Al + Cu), is used as a barrier layer, while a higher manganese silicide (HMS, MnSi1.7) layer is used as a well layer to enhance the power factor of MnSi1.7 film. It is found that the Al and Cu modulation doped MnSi1.7 film, Si: (Al + Cu)/MnSi1.7, has a power factor almost two times larger than that of only Al modulation doped MnSi1.7 film, Si: Al/MnSi1.7. It is also found that an undoped Si spacer layer between the Si: (Al + Cu) barrier layer and the MnSi1.7 well layer can enhance the power factor further. Finally, it is demonstrated that the MnSi1.7 film with double Si barrier layers, Si: (Al + Cu)/MnSi1.7/Si: (Al + Cu), has the highest power factor, 1423×10−6 W/m K2 at 783 K, which is very close to that of MnSi1.7 bulk material.
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