Conductance Switching Effect in the Cu/Cui0.76s0.14/Pt Structure

M. H. Zhai,K. B. Yin,L. Shi,J. Yin,Z. G. Liu
DOI: https://doi.org/10.1088/0022-3727/40/12/024
2007-01-01
Abstract:We have proposed a novel memory device with the Cu/CuI0.76S0.14/Pt structure. The intermediate non-stoichiometric film is prepared by pulsed laser deposition. This compound is found with the zincblende structure at room temperature by using x-ray diffraction. Conductance-voltage characteristics reveal that a switching effect exists when the polarity of the voltage biased is changed. By applying a voltage of +0.5 V on the copper electrode, our device is switched on while -0.8V induces the OFF-state. The switching operation could be repeated at least 103 times, and the G(ON)/G(OFF) ratio is more than 3 x 10(3). It is expected to be a promising model of nonvolatile memories. With the TEM study, we have analysed the migration of Cu+, S2- and I- under an electric field and attribute the switching effect to the formation and annihilation of ionic conducting paths.
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