Temperature Stability of Dielectric Constant and Energy Storage Properties of (Pb1-X,lax)(zr0.65,ti0.35)o3 Relaxor Ferroelectric Thin Films
Ming Wu,Yanan Xiao,Yongbing Liu,Huaqiang Li,Jinghui Gao,Lisheng Zhong,Xiaojie Lou
DOI: https://doi.org/10.1109/tdei.2021.009818
IF: 2.509
2021-01-01
IEEE Transactions on Dielectrics and Electrical Insulation
Abstract:Recently, dielectric energy storage materials and devices attracted much research interest due to its high-power density and the resulted applications. In this work, relaxor ferroelectric (Pb1-x,Lax)(Zr0.65,Ti0.35)O3 (abbreviated as PLZT100X, X = 0.06, 0.08, 0.10 and 0.12) thin films are deposited on Pt/Ti/SiO2/Si substrates by a sol-gel method, and temperature stability of relative dielectric constant as well as energy storage density of the PLZT thin films with different level of La doping are studied. The relative dielectric constant of the PLZT10 thin films is 873 at 1 kHz at 30°C, with maximum of variation of 7.6% in the temperature range from 30–200 °C, which indicates very high temperature stability. The energy storage density of the PLZT thin films is 38.8 J/cm3, 42.2 J/cm3, 33.5 J/cm3 and 36.0 J/cm3 with the La doping of 0.06, 0.08, 0.10 and 0.12, respectively, under the applied electric field of 2840 kV/cm. The energy efficiency of the PLZT thin films is above 70%. In addition, the energy storage density of the PLZT thin films shows good temperature stability, with about 20 J/cm3around the electric field of 1800 kV/cm in the temperature range from 30–150 °C.