The fabrication and study of ZnO-based thin film transistors

YANG Xiao-tian,MA Xian-mei,ZHU Hui-chao,GAO Wen-tao,Hu Jin,QI Xiao-wei,Bo Gao,DONG Xiu-ru,FU Guo-zhu,Hai Jing,Chao Wang,CHANG Yu-chun,DU Guo-tong,CAO Jian-lin
DOI: https://doi.org/10.3969/j.issn.1005-9490.2008.01.029
2008-01-01
Abstract:Bottom-gate-type thin film transistors using ZnO as an active channel layer (ZnO-TF-TS) have been constructed. The ZnO layers were deposited using metal organic chemical vapor deposition (MOCVD)[1-3] at about 360°C. SiO2 was used as the material of gate insulator to suppress the leakage current effectively and to enable the ZnO-TFT to operate successfully. The drain current on-to-off ratio of ZnO-TFTs fabricated on the substrate of glass is about 104. The average optical transmission of ZnO-TFTs in the visible portion is ∼ 80%. All above shows that it is possible to fabricate a transparent TFT using ZnO as an active channel layer instead of the traditional Si material.
What problem does this paper attempt to address?