Avalanche Breakdown Characteristics Of 3-D Curved-Abrupt Junctions Predicted By Equivalent Junction Technique

Jin He,Yingxue Li,Ru Huang,Xing Zhang,Yangyuan Wang
IF: 1.019
2002-01-01
Chinese Journal of Electronics
Abstract:The effect of the lateral curvature upon avalanche breakdown characteristics of 3-dimensional (3-D) curved-abrupt junctions is investigated analytically in this paper. Based on the equivalent junction transformation technique of Jin He et al., a semi-empirical analytical method, the breakdown voltage, peak electrical field and depletion layer width of the 3-D curved-abrupt junction are obtained and the influences of the curvatures of the lateral and metallurgical junction are also evaluated in details. The analytical breakdown voltages coincide with the numerical simulated and experimental results very well, showing the validity of the method presented here.
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