Failure Modes of Doubly Supported Capacitive Rf Mems Switches

LX Zhang,JW Zhang,YP Zhao,TX Yu
DOI: https://doi.org/10.1515/ijnsns.2002.3.3-4.353
2002-01-01
International Journal of Nonlinear Sciences and Numerical Simulation
Abstract:For the design of radio frequency micro-electro-mechanical systems (RF MEMS) switches, the reliability issue becomes increasingly important. This paper represents some failure phenomena of doubly supported capacitive RF MEMS switches that include observable destruction failure and directly measurable parameter degradation obtained from the actuating-voltage testing and scanning electron microscope (SEM) observation. The relevant failure modes as well as their failure mechanisms are identified.
What problem does this paper attempt to address?