Abstract:Micro displacement measuring device with high precision based on the principle of grating interference has high voltage sensitivity, thus weak jitter can cause irreparable impact on measuring results. These jitters include the air jitter, the ground vibration, and the fluctuation of the light source, etc. It becomes crucial for how to restrain the influence of outside jitter on the measurements of micro displacement effectively. Firstly, a series of experiments and analyses was carried on for the power fluctuation of the linearly polarized He-Ne laser, which drew that the power fluctuation range of light was greater than 7% which exceeded the fluctuation limit of 1%. Then, using the compensation measures of two signal acquisition and scaling operation, anti light disturbance came true. The analysis of experimental data shows that the effect of light source fluctuation on output voltage can be suppressed effectively through the compensation of optical path and scaling operation. The final amplitude of fluctuation of the output voltage is reduced by 60% than the initial state, and the displacement measurement error reduced from 1.95×10-7m to 1.40×10-8m.

Analysis And Study On Measurement Of Jitter And Its Precision

Measurement and Application of Industrial Robot Jitter

Measurement and Analysis of End Jitter of Six-Axis Industrial Robots.

Jitter Measurement Method for Multi-Level Disc Based on Quadratic Interpolation Algorithm

Design on Measurement System for Jitter of High-speed Optical Disc

Effect on Pseudo Code Ranging Precision by A/D Sampling Clock Jitter

Jitter Measurement Method for Multi-level Disc Based on Interpolation Algorithm

Anti Light Disturbance Analysis of the Measurement of High Precision micro Displacement

A Study and Analysis of High-Accuracy Network Synchronization Based on IEEE1588

Effect of Processing Rate on Regenerative Clock Jitter Performance in Pseudo-Random Code Ranging

Bursty Jitter In High-Speed I/O Due To Power-State Transition And Its Impact On Signal Integrity

Monitoring Method of Micro Flying Head Jitter in Optical Storage

Jitter testing technology of high-speed optical disc

Error analysis on numerical double integration in acceleration measurement with clock jitter

Understanding and Measuring the Jitter Generated by Digital CMOS Gates

SYNCHRONOUS MEASUREMENT PRECISION OF PHASOR MEASUREMENT UNIT

A Jitter Measurement Circuit Based On Dual Resolution Vernier Oscillator

Attosecond-precision timing jitter measurement based on temporal sampling method

A Transmission Error Analysis Method Using Monte Carlo Simulation

Study on Data Processing Method of High Precision Micro-tensile Stage

Comparision of Timing Jitter Robustness for a Few Kinds of Shaping Filter