Jitter testing technology of high-speed optical disc

徐端颐,谢登科
2005-01-01
Abstract:The jitter testing technology for high-speed optical disk was described in this paper. It is based on analysis of the jitter specification of high-speed optical disk. The principle of the system is the novel method of Two-Step Cascading Delay Line. The system was implemented using a single FPGA chip and VHDL programming language which has a character of high resolution, high reliability, compact architecture, simple operation and low cost. The testing results indicate that the system has internal jitter of 40 ps or lower with a single-shot resolution of 75ps and a multi-shot resolution of 5ps, and the system can be applied for jitter analysis of CD at a maximum speed of60X and DVD at 12X.
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