Truncated Lorch‐window Method Revealing the Off‐octahedral Ge in Nanocrystalline Ge2Sb2Te5

X. Q. Liu,X. B. Li,B. Zhang,S. B. Zhang,E. Ma,Z. Zhang,X. D. Han
DOI: https://doi.org/10.1002/pssb.201200377
2012-01-01
Abstract:Traditional Lorch‐window technique was modified to the truncated Lorch‐window through various truncation ranges to apply the Lorch‐window functions. The terminal ripples in radial distribution functions (RDFs) were weakened and the shoulder peak at 2.6 Å in crystalline Ge2Sb2Te5 (GST) was revealed by the indication of the off‐octahedral Ge. The Cs‐corrected high resolution transmission electron microscopy image and the corresponding simulations suggest that the off‐octahedral Ge atoms are indeed in the tetrahedral symmetry. These results indicate that the complex structural details in the intermediate phase of GST other than simple rock‐salt structure though the quantified information, such as the accurate atomic positions of the off‐octahedral Ge need being further clarified in the future. These results also reveal the significance of high‐Q signals in revealing the structures in short range order.
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