A Novel Recessed-Channel Tunneling Fet Design with Boosted Drive Current and Suppressed Leakage Current

Wei Wang,Song-Gan Zang,Xi Lin,Xiao-Yong Liu,Qing-Qing Sun,Peng-Fei Wang,David Wei Zhang
DOI: https://doi.org/10.1109/icsict.2012.6467618
2012-01-01
Abstract:In this paper, we propose a recessed-channel (U-shape-channel) tunneling field-effect-transistor (TFET) for 16-nm technology applications. This new device structure has the advantages of boosted I-on and suppressed I-off compared to the planar bulk-Si TFETs. Using Sentaurus TCAD simulations, it is found that the recessed channel will enlarge the tunneling area which will greatly enhance the drive current. Meanwhile, a steeper subthreshold swing (SS) will be realized in the U-shape TFET.
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