Study of Structural and Electrical Properties of Phosphorus-Doped p-Type ZnO Thin Films

Yipeng Wang,Jianqing Zhou,Qian Lu,Lilong Liu,Xin Zhang,Xiaojing Wu
DOI: https://doi.org/10.1143/JJAP.49.041103
IF: 1.5
2010-01-01
Japanese Journal of Applied Physics
Abstract:Phosphorus-doped ZnO thin films were fabricated by pulsed laser deposition (PLD) with different phosphorus pentoxide (P(2)O(5)) concentrations. The as-deposited films were annealed in nitrogen gas at 800 degrees C for 5 min. Hall effect measurement showed that all the as-deposited films were n-type semiconductors, and confirmed that after annealing treatment, a particular sample could be transformed from an n-type semiconductor into a p-type one. On the basis of the results of X-ray diffraction analysis and X-ray photoelectron spectroscopy, the mechanism of such transformation was discussed. (C) 2010 The Japan Society of Applied Physics
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