Predicting fatigue life of Solder joint with submodel method for a BGA package

Li-na DAI,Guo-zhong CHAI,ZHOU-Jun,Yu-mei BAO,Wei-na HAO
DOI: https://doi.org/10.3969/j.issn.1006-4303.2007.04.003
2007-01-01
Abstract:A new method-submodel finite element is applied to analysis the deformation of BGA chip under accelerated temperature cycling conditions(-25~125 ℃).The commonly used modified Darveaux's approach is used to estimate the fatigue life.In this procedure,firstly,a coarse model with many solder bumps is setup and analyzed.A critical solder bump,easiest to fail,is identified through analyzing the deformation situation caused by mismatch of swell factor between the chip and substrate in the thermal cyclic loading.Then the results are used as the boundary conditions in the refined submodel in order to investigate deformation of the components surrounding solder bump.Finally,the number of thermal fatigue cycles is investigated.Compared with traditional methods,this submodel method can provide a relatively accurate solution under the limited computing power.
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