A multi-scale approach to microstructure-sensitive thermal fatigue in solder joints
Yilun Xu,Jingwei Xian,Stoyan Stoyanov,Chris Bailey,Richard J. Coyle,Christopher M. Gourlay,Fionn P.E. Dunne
DOI: https://doi.org/10.1016/j.ijplas.2022.103308
IF: 8.5
2022-04-01
International Journal of Plasticity
Abstract:This paper presents a multi-scale modelling approach to investigate the underpinning mechanisms of microstructure-sensitive damage of single crystal Sn-3Ag-0.5Cu (wt%, SAC305) solder joints of a Ball Grid Array (BGA) board assembly subject to thermal cycling. The multi-scale scheme couples board-scale modelling at the continuum macro-scale and individual solder modelling at the crystal micro-scale. Systematic studies of tin crystal orientation and its role in fatigue damage have been compared to experimental observations. Crystallographic orientation is examined with respect to damage development, providing evidence-based optimal solder microstructural design for in-service thermomechanical fatigue.
materials science, multidisciplinary,engineering, mechanical,mechanics