The Nature of the Si Impurity in Ultrathin AlAs/GaAs Superlattices

EG WANG,LY ZHANG,HY WANG
DOI: https://doi.org/10.1088/0953-8984/1/43/007
1989-01-01
Journal of Physics Condensed Matter
Abstract:The electronic properties of n-type and p-type lightly doped (AIAs)n/(GaAs)n (n = 1, 3) superlattices are investigated through a theoretical study using the calculation of the total, local and partial density of states by the recursion method in the tight-binding approximation. The influence of an impurity located in the bulk, at or near the interface, and on the surface of these systems has been studied. For all cases, the electronic structures of a substitutional Si atom is qualitatively more similar to that of a group-III atom than to a group-V atom. The shift of the bottom of the conduction band and the top of the valence band with different types of doping is discussed. We also report that there is a local field when a Si atom is located at the interface, which is different for n-type and p-type doping structures, and an electronic centre when Si is in the bulk, Furthermore, this paper indicates dehybridisation of the surface impurity.
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