Twinning Defects in Spherical GeSi Alloy Nanocrystals

YM Yang,XL Wu,LW Yang,F Kong
DOI: https://doi.org/10.1016/j.jcrysgro.2006.03.020
IF: 1.8
2006-01-01
Journal of Crystal Growth
Abstract:GeSi alloy nanocrystals embedded in amorphous SiO2 matrix were fabricated via magnetron sputtering method and subsequent high-temperature annealing. The crystallite morphology and microstructural defects of the alloy nanocrystals were characterized by high-resolution transmission electron microscope observations. It is observed that GeSi nanocrystals with an average diameter of ∼10nm are mostly spherical and have low defect density. Such nanocrystals with twinning configurations, including single-twinning, multi-layer twinning, and five-fold twinning, were observed in ∼9% of total nanocrystals. The fabrication of spherical GeSi nanocrystals with low defect density is important for further studies in photoluminescence and acoustic phonon properties of the GeSi alloy nanocrystals.
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