Abstract:ZnGeP2 crystals are the frequency conversion materials with the excellent comprehensive performances in a range of 3–5 μm. However, the overlap of the absorption band and the pump wavelength range of optical parametric oscillator at 8–12 μm limits the application performance of the optical parametric oscillator and makes it impossible to achieve a far-infrared laser output. In this work, the formation energy and migration mechanism of six kinds of defects of ZnGeP2 crystal are discussed by density functional theory. The results show that two defective structures of \begin{document}$\rm{V_P}$\end{document}and \begin{document}$\rm{V_{Ge}}$\end{document} are difficult to form, while four defective structures of \begin{document}$\rm V_{\rm Zn}^ -$\end{document}, \begin{document}$\rm{Z{n_{Ge}}}$\end{document}, \begin{document}$ {\rm Ge}_{\rm Zn}^ + $\end{document} and \begin{document}$\rm{ G{e_{\rm Zn}} + {V_{\rm Zn}}}$\end{document} are easy to create. When the number of Ge atoms are slightly more than that of Zn atoms in ZnGeP2 crystals, the vacancy defects \begin{document}$\rm V_{\rm Zn}^ -$\end{document} form more easily than antistructure defects \begin{document}$ {\rm Ge}_{\rm Zn}^ + $\end{document} at 10 K, 500 K and 600 K, but the antistructure defects \begin{document}$ {\rm Ge}_{\rm Zn}^ + $\end{document} are easier to form than the vacancy defects \begin{document}$ {\text{V}}_{\text{Zn}}^{-} $\end{document} at 273 K and 400 K. There is a negative correlation between the volume expansion rate and the defect formation energy of ZnGeP2 crystal. The larger the volume expansion rate, the lower the defect formation energy is. The differential charge density shows that the electron cloud density among the atoms is enhanced in the defective structures of GeZn and VZn+GeZn. The electron cloud density at the lattices of vacancy defects is enhanced when the vacancy defects (VZn and VGe) and antistructure defects (GeZn and ZnGe) form the joint defects. Comparing with the defect-free cells, the charge of Zn atoms increases significantly, that of Ge is significantly reduced, and that of P does not change in the antistructure defect ZnGe or GeZn. The absorption spectra of ZnGeP2 crystal at 10K show that there is the significant absorption in a wavelength range from 0.6 μm to 2.5 μm for the four defective structures: VGe, VZn, ZnGe and GeZn, while the absorption in this range is small for the defective structures VP and GeZn+VZn. The VZn has the lowest migration energy, while VGe has the highest. The difficulty for VP to migrate depends on the space resistance, while the difficulty for VGe and VZn to migrate depend on the inter-atomic distance. This may be related to the small radius and high proportion of P atoms and the large radius and low proportion of Ge and Zn atom in ZnGeP2 crystal.

Defects and Their Movement in Pb and Ge Nanocrystals Characterized by Ultra-High Vacuum High Resolution Transmission Electron Microscope

Advanced Numerical Characterization of Mono-Crystalline Copper with Defects

In Situ Atomistic Observation of Grain Boundary Migration Subjected to Defect Interaction

Observation of regular defects formed on the surface of PbTe thin films grown by molecular beam epitaxy

Atomic Structures and Carrier Dynamics of Defects in a ZnGeP2 Crystal

Structural Defects in ZnGeP2 Single Crystals Revealed by X-ray Topography

Defects Induced by P+-Implanted in Silicon

Crystal Defects in Gan on (0001) Sapphire

Single-defect phonons imaged by electron microscopy

The structure, energy, and electronic states of vacancies in Ge nanocrystals

Surface-Condition-Dependent Deformation Mechanisms in Lead Nanocrystals.

Dislocations In Nanocrystalline Grains

Accommodation of Large Plastic Strains and Defect Accumulation in Nanocrystalline Ni Grains

Nanostructures of Defects in CdZnTe Single Crystals

Imaging of Microdefects in ZnGeP2 Single Crystals by X-ray Topography

Deformation Defects in Nanocrystalline Nickel

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

High-resolution transmission electron microscopy study on the anomalous structure of lead nanoparticles with UHV-MBE-TEM system

Direct observation of the grain boundaries acting as dislocation sources in nanocrystalline platinum

Investigation of Stability and Migration Mechanism of Defects in ZnGeP2 Crystals by Density Functional Theory

The origin of defects induced in ultra-pure germanium by Electron Beam Deposition