Abstract:The MgTiTa 2 O 8 ceramics were synthesized in the molten salt KCl. We have conducted an examination of the phases, microstructure, and microwave dielectric characteristics of MgTiTa 2 O 8 ceramics. This investigation involved the use of X-ray diffraction (XRD), Rietveld refinement, and scanning electron microscopy (SEM). The result demonstrated that MgTiTa 2 O 8 ceramics exhibited crystallization into a tri-rutile structure with space group P4 2 /mnm (136). With the increase of temperature, the relative density gradually increases, which benefit the dielectric constant and Q × f value. However, as the temperature continues to rise, there is a decrease in the ε r and Q × f value, which can be ascribed to over-sintering of the sample and a resultant reduction in the uniformity of grain size. The correlation between oxygen octahedron distortion dielectric, bond strength, packing fraction, and properties of microwave is discussed. The Q × f value increases with the increase of atomic packing density. The value of τ f decreases with the increase of bond energy and has no direct relation with the distortion of oxygen octahedron. The MgTiTa 2 O 8 ceramics sintered at 1150 °C exhibited superior dielectric characteristics of ε r = 35.1, Q × f = 32,200 GHz, τ f = + 95.4 ppm/°C.

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