Structural and Optical In-Plane Anisotropy of M-Plane GaN

Wu Chao,Xie Zi-Li,Zhang Rong,Zhang Zeng,Liu Bin,Li Yi,Fu De-Yi,Xiu Xiang-Qian,Han Ping,Shi Yi,Zheng You-Dou
DOI: https://doi.org/10.7498/aps.57.7190
IF: 0.906
2008-01-01
Acta Physica Sinica
Abstract:The m-plane GaN film is grown on LiAlO 2 by metal organic chemical vapor deposition. The single crystal orientation of m-plane GaN is demonstrated, According to the X-ray diffraction results, and the anisotropy strain is calculated. X-ray rocking curve at different φ angle shows obvious in plane structural anisotropy. Polarized photoluminescence is employed for the investigation of optical anisotropy. Both the wavelength and the intensity for the emission peak near band edge vary with the rotation of polarization angle, and can be explained by the degeneration of the subbands in valence band under anisotropy strain.
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