Fabrication and Characterization of P-Zno/n-zn0.8cd0.2o/n-zno Heterojunction

G. D. Yuan,Z. Z. Ye,J. Y. Huang,L. P. Zhu
DOI: https://doi.org/10.1016/j.ssc.2008.12.001
IF: 1.934
2009-01-01
Solid State Communications
Abstract:We report the fabrication of p-ZnO/n-Zn0.8Cd0.2O/n-ZnO heterojunctions that contain Al-N codoped p-ZnO, undoped n-Zn0.8Cd0.2O, and Al-doped n-ZnO layers. An InZn alloy is used as the p- and n-Zno Ohmic contact electrodes. This structure exhibits improved rectifying p-n junction behavior, with forward turn-on voltage in the range of 3-5 V. The reverse breakdown voltage can be as high as 15 V, with 10(-6)- A reverse leakage Current. Photoluminescence spectra show strong near band-edge emissions for both p- and n-ZnO at 368 nm and for undoped n-Zn0.8Cd0.2O, Which is substantially red-shifted to 399 nm. Crown Copyright (C) 2008 Published by Elsevier Ltd. All rights reserved.
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