REW Program for the HRTEM Image Simulation, the Alignment and the Focus Variation Image Reconstruction

F. Lin,J. W. Weng,J. H. Chen

DOI: https://doi.org/10.1017/s143192760909285x

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

What problem does this paper attempt to address?

REW– Exit‐wave Reconstruction and Alignments for Focus‐variation High‐resolution Transmission Electron Microscopy Images

F. Lin,Q. Chen,L.-M. Peng

DOI: https://doi.org/10.1107/s0021889807008588

IF: 4.868

2007-01-01

Journal of Applied Crystallography

Abstract:A Windows-based computer program has been developed for exit-wave reconstruction and experimental high-resolution transmission electron microscopy image alignment. While the exit-wave reconstruction is performed mainly using the maximum-likelihood method, image alignments may be carried out using several algorithms, including the time-consuming but robust genetic algorithm.
High Resolution Tomographic Phase Microscopy

Peng Xiu,Yue Fang,Yifan Wang,Jiannan Fan,Cuifang Kuang,Yingke Xu,Xu Liu

DOI: https://doi.org/10.1364/isa.2016.im3f.7

2016-01-01

Abstract:The high resolution tomographic rotates the reference arm and the sample arm to detect the quantitative phase information and the result 3D image has higher resolution and SNR.
Resolving the Individual Carbon Atoms of Graphene Monolayer by REW Software

林芳,金传洪

DOI: https://doi.org/10.3969/j.issn.1000-6281.2010.02.003

2010-01-01

Abstract:By means of the electron beam irradiation-induced layer-by-layer sputtering,graphene monolayers were successfully prepared inside the transmission electron microscope (TEM).It is difficult to directly and clearly resolve single carbon atoms from the pristine aberration-corrected high resolution TEM (HRTEM) images,due to the relative lower signal-to-noise ratio.Therefore,the exit-wave reconstruction method was employed for the through-focal image series.A hexagonal lattice of carbon atoms could be unambiguously resolved from the reconstructed phase image.The image processing,including the HRTEM simulation and HRTEM image reconstruction,are performed using a self-developed software of REW.
Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Hengjie Tang,Chenxue Wu,Wei Gong,Yao Zheng,Xinpei Zhu,Jiahao Wang,Ke Si

DOI: https://doi.org/10.1002/jbio.201700293

IF: 3.3899

2018-01-01

Journal of Biophotonics

Abstract:We develop a confocal system equipped with optimal elliptical apertures to improve axial point spread function and signal-to-background ratio (SBR) for different detector sizes. By adjusting the parameters of the elliptical apertures, the axial half width at half-maximum can be reduced to 4.986 (described in optical coordinates) and SBR can be improved to 0.176. We evaluate this system with the 1951 USAF resolution test chart and the primary cultured neuron from SD rat stained by Map-2, and observe better imaging performance, which indicates the potential applications in biological science.
Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

F Lin,X B Ren,W P Zhou,L Y Zhang,Y Xiao,Q Zhang,H T Xu,H Li,C H Jin

DOI: https://doi.org/10.1016/j.micron.2018.07.001

IF: 2.381

2018-01-01

Micron

Abstract:We propose a novel algorithm to numerically retrieve the phase of the exit-wave function from a high-resolution transmission electron microscopy (HRTEM) image of a weak-phase object material, e.g., graphene and hexagonal boron nitride monolayers. It theoretically only requires a single HRTEM image to retrieve the phase under the assumption of a weak-phase object. In addition, it can remove the effects of geometrical aberrations up to fifth order, and also improve the degraded information due to the finite temporal and spatial coherence. We further present its applications and successfully demonstrate the identification of the lattice atoms and line defects in single HRTEM image of graphene.
Tunable-illumination for Laser Fourier Ptychographic Microscopy Based on a Background Noise-Reducing System

Xiao Tao,Jinlei Zhang,Chenning Tao,Peng Sun,Rengmao Wu,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2020.125764

IF: 2.4

2020-01-01

Optics Communications

Abstract:It is inherently difficult for a conventional microscopic imaging system to produce images with both wide field of view (FOV) and high-resolution because of its limited space bandwidth product. Fourier ptychographic microscopy (FPM) has been developed to overcome this limitation by using angle-varied illumination to enhance the performance of the system. In this paper, we propose a FPM imaging approach that employs a laser source with a newly developed illumination control optical system. The proposed system consists of a digital micromirror device and a zoom system with a condenser lens to provide sample illumination with angle-varied pattern directions and controllable pattern sizes. In addition, a total internal reflection prism is employed in the system to remove unexpected background noise and extend the FOV for reconstruction. The proposed system is validated against a USAF resolution target and a biological sample, and as a result reconstructs images with higher resolution and more details once the positional misalignment correction algorithm is employed. We envision that the proposed FPM system will be suitable for high-speed imaging applications.
A New Scheme for the Exit-Wave Reconstruction from A Small Set of Focus Series of Hrem Images

F Lin,Q Chen,LM Peng

DOI: https://doi.org/10.4028/www.scientific.net/msf.475-479.4059

2005-01-01

Materials Science Forum

Abstract:A new procedure is proposed for the exit electron wave reconstruction using a small set of high-resolution electron microscopy (HREM) images. This procedure is similar to that proposed by van Dyck and coworkers, but the relative shifts between different HREM images are obtained via the genetic algorithm instead of the more widely used cross-correlation function (XCF) method. The new procedure is demonstrated using simulated HREM images with added noise, and shown to be able to deal with situation where the scheme based on the method of XCF is not applicable.
New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy

Edgar Rauch,Patrick Harrison,Xuyang Zhou,Michael Herbig,Wolfgang Ludwig,Muriel Véron

DOI: https://doi.org/10.3390/sym13091675

2021-09-11

Symmetry

Abstract:ACOM/TEM is an automated electron diffraction pattern indexing tool that enables the structure, phase and crystallographic orientation of materials to be routinely determined. The software package, which is part of ACOM/TEM, has substantially evolved over the last fifteen years and has pioneered numerous additional functions with the constant objective of improving its capabilities to make the tremendous amount of information contained in the diffraction patterns easily available to the user. Initially devoted to the analysis of local crystallographic texture, and as an alternative to both X-ray pole figure measurement and EBSD accessories for scanning electron microscopes, it has rapidly proven itself effective to distinguish multiple different phases contained within a given sample, including amorphous phases. Different strategies were developed to bypass the inherent limitations of transmission electron diffraction patterns, such as 180° ambiguities or the complexity of patterns produced from overlapping grains. Post processing algorithms have also been developed to improve the angular resolution and to increase the computing rate. The present paper aims to review some of these facilities. On-going works on 3D reconstruction are also introduced.

multidisciplinary sciences
Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

Xiaohan Zhang,Shaowen Chen,Shuya Wang,Ying Huang,Chuanhong Jin,Fang Lin

DOI: https://doi.org/10.1111/jmi.13335

IF: 1.9522

2024-06-01

Journal of Microscopy

Abstract:High‐resolution transmission electron microscopy (HRTEM) images can capture the atomic‐resolution details of the dynamically changing structure of nanomaterials. Here, we propose a new scheme and an improved reconstruction algorithm to reconstruct the exit wave function for each image in a focal series of HRTEM images to reveal structural changes. In this scheme, the wave reconstructed from the focal series of images is treated as the initial wave in the reconstruction process for each HRTEM image. Additionally, to suppress noise at the frequencies where the signal is weak due to the modulation of the lens transfer function, a weight factor is introduced in the improved reconstruction algorithm. The advantages of the new scheme and algorithms are validated by using the HRTEM images of a natural specimen and a single‐layer molybdenum disulphide. This algorithm enables image resolution enhancement and lens aberration removal, while potentially allowing the visualisation of the structural evolution of nanostructures.

microscopy
High-resolution 3D reconstruction of microtubule structures by quantitative multi-angle total internal reflection fluorescence microscopy

Luhong Jin,Jian Wu,Peng Xiu,Jiannan Fan,Miao Hu,Cuifang Kuang,Yingke Xu,Xiaoxiang Zheng,Xu Liu

DOI: https://doi.org/10.1016/j.optcom.2016.04.054

IF: 2.4

2017-01-01

Optics Communications

Abstract:Total internal reflection fluorescence microscopy (TIRFM) has been widely used in biomedical research to visualize cellular processes near the cell surface. In this study, a novel multi-angle ring-illuminated TIRFM system, equipped with two galvo mirrors that are on conjugate plan of a 4f optical system was developed. Multi-angle TIRFM generates images with different penetration depths through the controlled variation of the incident angle of illuminating laser. We presented a method to perform three-dimensional (3-D) reconstruction of microtubules from multi-angle TIRFM images. The performance of our method was validated in simulated microtubules with variable signal-to-noise ratios (SNR) and the axial resolution and accuracy of reconstruction were evaluated in selecting different numbers of illumination angles or in different SNR conditions. In U373 cells, we reconstructed the 3-D localization of microtubules near the cell surface with high resolution using over a hundred different angles. Theoretically, the presented TIRFM setup and 3-D reconstruction method can achieve 40nm axial resolution in experimental conditions where SNR is as low as 2, with ~35 different illumination angles. Moreover, our system and reconstruction method have the potential to be used in live cells to track membrane dynamics in 3-D.
Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

JS Wu,AM Kim,RG Marvin,BD Myers,TK Woodruff,TV O'Halloran,VP Dravid,K McIlwrath,SY Li

DOI: https://doi.org/10.1017/s1431927610057648

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Qfocus: Structure Reconstruction from Focal Series of Hrtem Images

Xiaodong Zou,Wei Wan,Sven Hovmoller

DOI: https://doi.org/10.1107/s0108767311097388

2011-01-01

Abstract:High-resolution transmission electron microscopy (HRTEM) images are usually not directly interpretable in terms of crystal structure due to various aberrations in the microscope lenses. Although significant progress has been made recently in the development of hardware aberration correctors, especially spherical-aberration correctors [1], the majority of transmission electron microscopes in use today are traditional ones and structure reconstruction by software methods still serves as a cost-effective alternative. Representative software methods include exit wave reconstruction using throughfocus image series [2] and contrast transfer function (CTF) correction methods using single images or image series [3]. Here we present a CTF-correction based structure reconstruction method, using throughfocus series of HRTEM images taken with a fixed focus step, in which all images in the series are corrected for CTFs and combined into a structure image. To determine the starting defocus of the series, trial defocus values in a large range are tested and CTF corrections are made to all images. The similarity of the phases of the Fourier transform between the corrected images is used as the criterion to judge whether a trial defocus value is close to the true one. The two-fold astigmatism is determined by dividing Fourier transforms into sectors and determining the defocus along different directions. As crystallographic phases are used in defocus and astigmatism determination, no amorphous areas are required in the images. On the other hand, since CTF correction is done for all pixels within the resolution limit in reciprocal space, this method works for both perfect and defect crystals. The method was applied on a 20-image focal series of Ca0.28Ba0.72Nb2O6 (P4bm, a=12.43Å, c=3.96Å). The experimental images were collected with a focus step of -26.6 Å on a JEOL-2100F transmission electron microscope equipped with field emission gun. The starting defocus of the series is determined to be -260 Å and the two-fold astigmatism is 33 Å with an azimuth angle of 13° clockwise with respect to the x-axis of the images. The reconstructed image is shown in the figure below, in which atoms appear as black dots. Not only metals but also atomic columns as light as oxygen can be seen. The present method has the advantages of automatic defocus and two-fold astigmatism determination without amorphous areas, less CTF crossover problems and improved signal-to-noise ratio as compared to CTF correction methods using single images. The method has been implemented in a user-friendly program, QFocus, which we hope may help non-TEM experts to use HRTEM images for solving their structure problems.
3D Structure Determination from Hrtem and Electron Diffraction Tomography

Xiaodong Zou,Daliang Zhang,Peter Oleynikov,Junliang Sun,Sven Hovmoller

DOI: https://doi.org/10.1017/s1431927609099413

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Practical and Theoretic Development of Phase Contrast Devices for Advanced Biologic Imaging

F-R Chen,T-W Huang,K-W Liu,J-S Tsai,Y-J Chung,F Tseng,C-S Chang

DOI: https://doi.org/10.1017/s1431927610058794

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe

Shoucong Ning,Wenhui Xu,Pengju Sheng,Leyi Loh,Stephen Pennycook,Fucai Zhang,Michel Bosman,Qian He

2024-06-23

Abstract:As a burgeoning technique, out-of-focus electron ptychography offers the potential for rapidly imaging atomic-scale large fields of view (FoV) using a single diffraction dataset. However, achieving robust out-of-focus ptychographic reconstruction poses a significant challenge due to the inherent scan instabilities of electron microscopes, compounded by the presence of unknown aberrations in the probe-forming lens. In this study, we substantially enhance the robustness of out-of-focus ptychographic reconstruction by extending our previous calibration method (the Fourier method), which was originally developed for the in-focus scenario. This extended Fourier method surpasses existing calibration techniques by providing more reliable and accurate initialization of scan positions and electron probes. Additionally, we comprehensively explore and recommend optimized experimental parameters for robust out-of-focus ptychography, includingaperture size and defocus, through extensive simulations. Lastly, we conduct a comprehensive comparison between ptychographic reconstructions obtained with focused and defocused electron probes, particularly in the context of low-dose and precise phase imaging, utilizing our calibration method as the basis for evaluation.

Optics,Materials Science
Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

PD Nellist,P Wang,G Behan,AI Kirkland,A Hashimoto,M Shimojo,K Mitsuishi,M Takeguchi,E Cosgriff,AJ D'Alfonso,LJ Allen,SD Findlay

DOI: https://doi.org/10.1017/s1431927610057533

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Alignment and Characterisation of Remote-Refocusing Systems

Wenzhi Hong,Hugh Sparks,Chris Dunsby

DOI: https://doi.org/10.1364/AO.500281

2023-07-15

Abstract:The technique of remote refocusing is used in optical microscopy to provide rapid axial scanning without mechanically perturbing the sample and in techniques such as oblique plane microscopy that build on remote refocusing to image a tilted plane within the sample. The magnification between the pupils of the primary (O1) and secondary (O2) microscope objectives of the remote-refocusing system has been shown previously by Mohanan and Corbett [J Microsc, 288(2):95-105 (2022)] to be crucial in obtaining the broadest possible remote-refocusing range. In this work, we performed an initial alignment of a remote-refocusing system and then studied the effect of axial misalignments of O1 and O2, axial misalignment of the primary tube lens (TL1) relative to the secondary tube lens (TL2), lateral misalignments of TL2 and changes in the focal length of TL2. For each instance of the setup, we measured the mean point spread function FWHMxy of 100 nm fluorescent beads, the normalised bead integrated fluorescence signal, and calculated the axial and lateral distortion of the system: all of these quantities were mapped over the remote-refocusing range and as a function of lateral image position. This allowed us to estimate the volume over which diffraction-limited performance is achieved and how this changes with the alignment of the system.

Optics
Thermal diffuse scattering and REM image-contrast preservation

L.-M. Peng,J.M. Cowley

DOI: https://doi.org/10.1016/0304-3991(89)90243-X

IF: 2.994

1989-01-01

Ultramicroscopy

Abstract:The diffuse diffraction spots occurring in reflection high energy electron diffraction (RHEED) patterns and not lying on the circle in which the Ewald sphere intercepts a reciprocal plane have been selected for reflection electron microscopy (REM) imaging of Pt(111) surfaces. Application of the boundary conditions for reflection electron diffraction to the inelastic diffusely scattered electrons requires that the thermal diffuse scattering process gives these diffuse diffraction spots in RHEED patterns, and there is no contribution from elastically scattered electrons to the image contrast. Contrast resulting from surface steps has been observed to be well preserved around the near-focus region in the REM images. It has also been observed that the contrast is smeared out rapidly in the off-focus region due to the diffuseness of the thermal diffuse spot used for REM imaging.

REW Program for the HRTEM Image Simulation, the Alignment and the Focus Variation Image Reconstruction

REW– Exit‐wave Reconstruction and Alignments for Focus‐variation High‐resolution Transmission Electron Microscopy Images

High Resolution Tomographic Phase Microscopy

Resolving the Individual Carbon Atoms of Graphene Monolayer by REW Software

Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

Tunable-illumination for Laser Fourier Ptychographic Microscopy Based on a Background Noise-Reducing System

A New Scheme for the Exit-Wave Reconstruction from A Small Set of Focus Series of Hrem Images

New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy

Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

High-resolution 3D reconstruction of microtubule structures by quantitative multi-angle total internal reflection fluorescence microscopy

Imaging and Elemental Mapping of Biological Specimens with the Hitachi HD-2300A Dual-EDS Scanning Transmission Electron Microscope

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Qfocus: Structure Reconstruction from Focal Series of Hrtem Images

3D Structure Determination from Hrtem and Electron Diffraction Tomography

Practical and Theoretic Development of Phase Contrast Devices for Advanced Biologic Imaging

Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Alignment and Characterisation of Remote-Refocusing Systems

Thermal diffuse scattering and REM image-contrast preservation