Abstract:High-resolution transmission electron microscopy (HRTEM) images are usually not directly interpretable in terms of crystal structure due to various aberrations in the microscope lenses. Although significant progress has been made recently in the development of hardware aberration correctors, especially spherical-aberration correctors [1], the majority of transmission electron microscopes in use today are traditional ones and structure reconstruction by software methods still serves as a cost-effective alternative. Representative software methods include exit wave reconstruction using throughfocus image series [2] and contrast transfer function (CTF) correction methods using single images or image series [3]. Here we present a CTF-correction based structure reconstruction method, using throughfocus series of HRTEM images taken with a fixed focus step, in which all images in the series are corrected for CTFs and combined into a structure image. To determine the starting defocus of the series, trial defocus values in a large range are tested and CTF corrections are made to all images. The similarity of the phases of the Fourier transform between the corrected images is used as the criterion to judge whether a trial defocus value is close to the true one. The two-fold astigmatism is determined by dividing Fourier transforms into sectors and determining the defocus along different directions. As crystallographic phases are used in defocus and astigmatism determination, no amorphous areas are required in the images. On the other hand, since CTF correction is done for all pixels within the resolution limit in reciprocal space, this method works for both perfect and defect crystals. The method was applied on a 20-image focal series of Ca0.28Ba0.72Nb2O6 (P4bm, a=12.43Å, c=3.96Å). The experimental images were collected with a focus step of -26.6 Å on a JEOL-2100F transmission electron microscope equipped with field emission gun. The starting defocus of the series is determined to be -260 Å and the two-fold astigmatism is 33 Å with an azimuth angle of 13° clockwise with respect to the x-axis of the images. The reconstructed image is shown in the figure below, in which atoms appear as black dots. Not only metals but also atomic columns as light as oxygen can be seen. The present method has the advantages of automatic defocus and two-fold astigmatism determination without amorphous areas, less CTF crossover problems and improved signal-to-noise ratio as compared to CTF correction methods using single images. The method has been implemented in a user-friendly program, QFocus, which we hope may help non-TEM experts to use HRTEM images for solving their structure problems.

REW– Exit‐wave Reconstruction and Alignments for Focus‐variation High‐resolution Transmission Electron Microscopy Images

Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

A 3D Aligning Method for Stimulated Emission Depletion Microscopy Using Fluorescence Lifetime Distribution.

A New Scheme for the Exit-Wave Reconstruction from A Small Set of Focus Series of Hrem Images

REW Program for the HRTEM Image Simulation, the Alignment and the Focus Variation Image Reconstruction

Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

A Positional Misalignment Correction Method for Fourier Ptychographic Microscopy Based on the Quasi-Newton Method with a Global Optimization Module

Automated Acquisition of Cryo-Electron Micrographs for Single Particle Reconstruction on an FEI Tecnai Electron Microscope.

New Features in Crystal Orientation and Phase Mapping for Transmission Electron Microscopy

Qfocus: Structure Reconstruction from Focal Series of Hrtem Images

A user-friendly nano-CT image alignment and 3D reconstruction platform based on LabVIEW

The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images.

A New Method for Axial Decay Function Calibration of Evanescent Field in Multi-Angle Total Internal Reflection Fluorescence Microscopy

An Analytical Method of Automatic Alignment for Electron Tomography.

Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe

Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography

Adaptive Tilt-Series Alignment with Feature Resampling in Cryo-Electron Tomography

Advanced Techniques in Automated High Resolution Scanning Transmission Electron Microscopy

Fine-grained alignment of cryo-electron subtomograms based on MPI parallel optimization

BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization

The Ettention software package