Abstract:Multi-scale 3D characterization is widely used by materials scientists to further their understanding of the relationships between microscopic structure and macroscopic function. Scientific computed tomography (CT) instruments are one of the most popular choices for 3D non-destructive characterization of materials at length scales ranging from the angstrom-scale to the micron-scale. These instruments typically have a source of radiation that interacts with the sample to be studied and a detector assembly to capture the result of this interaction. A collection of such high-resolution measurements are made by re-orienting the sample which is mounted on a specially designed stage/holder after which reconstruction algorithms are used to produce the final 3D volume of interest. The end goal of scientific CT scans include determining the morphology,chemical composition or dynamic behavior of materials when subjected to external stimuli. In this article, we will present an overview of recent advances in reconstruction algorithms that have enabled significant improvements in the performance of scientific CT instruments - enabling faster, more accurate and novel imaging capabilities. In the first part, we will focus on model-based image reconstruction algorithms that formulate the inversion as solving a high-dimensional optimization problem involving a data-fidelity term and a regularization term. In the last part of the article, we will present an overview of recent approaches using deep-learning based algorithms for improving scientific CT instruments.

A user-friendly nano-CT image alignment and 3D reconstruction platform based on LabVIEW

A Wavelet-Based Single-View Reconstruction Approach for Cone Beam X-Ray Luminescence Tomography Imaging.

A LabVIEW based user-friendly X-ray phase-contrast imaging system software platform

A User-Friendly Labview Software Platform for Grating Based X-Ray Phase-Contrast Imaging

Algorithm-driven Advances for Scientific CT Instruments: From Model-based to Deep Learning-based Approaches

An Electron Beam Linear Scanning Mode for Industrial Limited-Angle Nano-Computed Tomography.

Deep-learning-based Image Registration for Nano-Resolution Tomographic Reconstruction

Optimization of Image Quality and Acquisition Time for Lab-Based X-ray Microtomography Using an Iterative Reconstruction Algorithm

Automatic Marker-Based Alignment Method for a Nano-Resolution Full-Field Transmission X-ray Microscope.

Model-driven CT reconstruction algorithm for nano-resolution X-ray phase contrast imaging

AIDM-CT: software for cone-beam X-ray tomography and deep-learning-based analysis

Reconstruction of Limited-Angle and Few-View Nano-Ct Image Via Total Variation Iterative Reconstruction

In Situ Investigation of the 3D Mechanical Microstructure at Nanoscale: Nano-Ct Imaging Method of Local Small Region in Large Scale Sample.

Automatic Synchrotron Tomographic Alignment Schemes Based on Genetic Algorithms and Human-in-the-loop Software

Analysis And Correction Of Dynamic Geometric Misalignment For Nano-Scale Computed Tomography At Bsrf

Feature Detection Network-Based Correction Method for Accurate Nano-Tomography Reconstruction.

Design, Optimization and Testing of a Multi-Beam Micro-Ct Scanner Based on Multi-Beam Field Emission X-Ray Technology

LabVIEW-based software design for micro-CT image acquisition control system

Simulation of High-Resolution X-ray Microscopic Images for Improved Alignment

Preliminary Research on Laser Plasma Accelerator based Inverse Compton Scattering X-ray Imaging