Abstract:High-resolution transmission electron microscopy (HRTEM) images are usually not directly interpretable in terms of crystal structure due to various aberrations in the microscope lenses. Although significant progress has been made recently in the development of hardware aberration correctors, especially spherical-aberration correctors [1], the majority of transmission electron microscopes in use today are traditional ones and structure reconstruction by software methods still serves as a cost-effective alternative. Representative software methods include exit wave reconstruction using throughfocus image series [2] and contrast transfer function (CTF) correction methods using single images or image series [3]. Here we present a CTF-correction based structure reconstruction method, using throughfocus series of HRTEM images taken with a fixed focus step, in which all images in the series are corrected for CTFs and combined into a structure image. To determine the starting defocus of the series, trial defocus values in a large range are tested and CTF corrections are made to all images. The similarity of the phases of the Fourier transform between the corrected images is used as the criterion to judge whether a trial defocus value is close to the true one. The two-fold astigmatism is determined by dividing Fourier transforms into sectors and determining the defocus along different directions. As crystallographic phases are used in defocus and astigmatism determination, no amorphous areas are required in the images. On the other hand, since CTF correction is done for all pixels within the resolution limit in reciprocal space, this method works for both perfect and defect crystals. The method was applied on a 20-image focal series of Ca0.28Ba0.72Nb2O6 (P4bm, a=12.43Å, c=3.96Å). The experimental images were collected with a focus step of -26.6 Å on a JEOL-2100F transmission electron microscope equipped with field emission gun. The starting defocus of the series is determined to be -260 Å and the two-fold astigmatism is 33 Å with an azimuth angle of 13° clockwise with respect to the x-axis of the images. The reconstructed image is shown in the figure below, in which atoms appear as black dots. Not only metals but also atomic columns as light as oxygen can be seen. The present method has the advantages of automatic defocus and two-fold astigmatism determination without amorphous areas, less CTF crossover problems and improved signal-to-noise ratio as compared to CTF correction methods using single images. The method has been implemented in a user-friendly program, QFocus, which we hope may help non-TEM experts to use HRTEM images for solving their structure problems.

A New Scheme for the Exit-Wave Reconstruction from A Small Set of Focus Series of Hrem Images

Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

Image Scanning Fluorescence Emission Difference Microscopy Based On A Detector Array

Emission Difference Super-Resolution Microscopy with Optical Lattices Scanning and Wide Field Detection

A Method for Achieving Multiple Foci with Subdiffraction Resolution along the Axial Direction

Super-Resolution Microscopy Based on Fluorescence Emission Difference of Cylindrical Vector Beams

REW– Exit‐wave Reconstruction and Alignments for Focus‐variation High‐resolution Transmission Electron Microscopy Images

Inverse Problem of the Multislice Method in Retrieving Projected Complex Potentials from the Exit-Wave Function.

Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Qfocus: Structure Reconstruction from Focal Series of Hrtem Images

Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography

The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images.

Image reconstruction from electron and X-ray diffraction patterns using iterative algorithms: experiment and simulation

A Flexible Phase Retrieval Framework for Flux-limited Coherent X-Ray Imaging

Robust Ptychographic Reconstruction with an Out-of-Focus Electron Probe

An Efficient Electron Ptychography Method for Retrieving the Object Spectrum from Only a Few Iterations

Resolution Enhancement of Saturated Fluorescence Emission Difference Microscopy

Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone

Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning

A Fourier-based Approach for Iterative 3D Reconstruction from Cryo-EM Images