Abstract:High-resolution transmission electron microscopy (HRTEM) images are usually not directly interpretable in terms of crystal structure due to various aberrations in the microscope lenses. Although significant progress has been made recently in the development of hardware aberration correctors, especially spherical-aberration correctors [1], the majority of transmission electron microscopes in use today are traditional ones and structure reconstruction by software methods still serves as a cost-effective alternative. Representative software methods include exit wave reconstruction using throughfocus image series [2] and contrast transfer function (CTF) correction methods using single images or image series [3]. Here we present a CTF-correction based structure reconstruction method, using throughfocus series of HRTEM images taken with a fixed focus step, in which all images in the series are corrected for CTFs and combined into a structure image. To determine the starting defocus of the series, trial defocus values in a large range are tested and CTF corrections are made to all images. The similarity of the phases of the Fourier transform between the corrected images is used as the criterion to judge whether a trial defocus value is close to the true one. The two-fold astigmatism is determined by dividing Fourier transforms into sectors and determining the defocus along different directions. As crystallographic phases are used in defocus and astigmatism determination, no amorphous areas are required in the images. On the other hand, since CTF correction is done for all pixels within the resolution limit in reciprocal space, this method works for both perfect and defect crystals. The method was applied on a 20-image focal series of Ca0.28Ba0.72Nb2O6 (P4bm, a=12.43Å, c=3.96Å). The experimental images were collected with a focus step of -26.6 Å on a JEOL-2100F transmission electron microscope equipped with field emission gun. The starting defocus of the series is determined to be -260 Å and the two-fold astigmatism is 33 Å with an azimuth angle of 13° clockwise with respect to the x-axis of the images. The reconstructed image is shown in the figure below, in which atoms appear as black dots. Not only metals but also atomic columns as light as oxygen can be seen. The present method has the advantages of automatic defocus and two-fold astigmatism determination without amorphous areas, less CTF crossover problems and improved signal-to-noise ratio as compared to CTF correction methods using single images. The method has been implemented in a user-friendly program, QFocus, which we hope may help non-TEM experts to use HRTEM images for solving their structure problems.

Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

Surface wave illumination Fourier ptychographic microscopy.

A New Scheme for the Exit-Wave Reconstruction from A Small Set of Focus Series of Hrem Images

Qfocus: Structure Reconstruction from Focal Series of Hrtem Images

Three-dimensional stacked filter (3DSF): a nonlinear filter for series images of TEM

REW– Exit‐wave Reconstruction and Alignments for Focus‐variation High‐resolution Transmission Electron Microscopy Images

Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography

Object Wave Reconstruction by Phase-Plate Transmission Electron Microscopy

High-resolution 3D reconstruction of microtubule structures by quantitative multi-angle total internal reflection fluorescence microscopy

High-Resolution Scanning X-ray Diffraction Microscopy

Exit Wavefunction Reconstruction from Single Transmission Electron Micrographs with Deep Learning

The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images.

Dynamical Diffraction of High-Energy Electrons Investigated by Focal Series Momentum-Resolved Scanning Transmission Electron Microscopy at Atomic Resolution.

HAADF-STEM Image Resolution Enhancement Using High-Quality Image Reconstruction Techniques: Case of the Fe3O4(111) Surface

Atomic Resolution Imaging of Light Elements in a Crystalline Environment using Dynamic Hollow-Cone Illumination Transmission Electron Microscopy

Simulated TEM imaging of a heavily irradiated metal

Amplitude Contrast Imaging in High-Resolution Transmission Electron Microscopy of Ferroelectric Superlattice Film

Selective signal enhancement in Fourier space as a tool for discovering ultrastructural organization of macromolecules from in situ TEM

Solving complex nanostructures with ptychographic atomic electron tomography

Towards 3D Electron Ptychographic Reconstruction