Simulated TEM imaging of a heavily irradiated metal

D.R. Mason,M. Boleininger,J. Haley,E. Prestat,G. He,F. Hofmann,S.L. Dudarev
2024-01-26
Abstract:We recast the Howie-Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows very rapid computation of simulated TEM images for arbitrarily complex atomistic configurations of lattice defects and dislocations in the dynamical two beam approximation. Large scale massively-overlapping cascade simulations performed with molecular dynamics, are used to generate representative high-dose nanoscale irradiation damage in tungsten at room temperature, and we compare the simulated TEM images to experimental TEM images with similar irradiation and imaging conditions. The simulated TEM shows 'white-dot' damage in weak-beam dark-field imaging conditions, in line with our experimental observations and as expected from previous studies, and in bright-field conditions a dislocation network is observed. In this work we can also compare the images to the nanoscale lattice defects in the original atomic structures, and find that at high dose the white spots are not only created by small dislocation loops, but rather arise from nanoscale fluctuations in strains around curved sections of dislocation lines.
Materials Science
What problem does this paper attempt to address?
The problem that this paper attempts to solve is how to better understand and characterize nanoscale defects in metallic materials under high - dose irradiation through simulating transmission electron microscope (TEM) images. Specifically, the researchers re - derived the Howie - Whelan equation so that it only depends on atomic positions rather than local atomic displacements, enabling the rapid calculation of simulated TEM images under the dynamic two - beam approximation for any complex atomic configuration. This method is particularly suitable for representative high - dose nanoscale irradiation damage generated by large - scale overlapping cascade simulations, which are produced in tungsten at room temperature through molecular dynamics simulations. ### Main problems 1. **How to efficiently generate simulated TEM images**: Traditional methods are less efficient when dealing with complex atomic configurations. This paper proposes a new method to quickly calculate simulated TEM images by using only atomic positions instead of displacement fields. 2. **Microstructural characteristics of metallic materials under high - dose irradiation**: Through simulation and experimental comparison, the researchers explored the formation and evolution of nanoscale defects in metallic materials under high - dose irradiation. 3. **Consistency between simulation and experimental results**: Verify the qualitative consistency between the TEM images generated by simulation and those observed experimentally, especially under weak - beam dark - field and bright - field conditions. ### Solutions - **Re - derivation of the Howie - Whelan equation**: Build a complex - phase field \(x(r)=\exp(ig\cdot r)\) by relying only on atomic positions and perform interpolation to form a continuous field, thus avoiding the calculation of complex displacement or strain fields. - **Large - scale molecular dynamics simulation**: Use the LAMMPS software to perform multiple 10 keV primary Knock - on Atom (PKA) collision cascade simulations on a large single - crystal box containing 21 million tungsten atoms until reaching an NRT dose of 1 dpa. - **Experimental verification**: Use a JEOL - 2100 TEM to image the irradiated tungsten samples and compare them with the simulation results. ### Key findings - **Consistency between simulation and experiment**: Under weak - beam dark - field conditions, the simulated TEM images show "white - dot" damage, which is consistent with the experimental observations. Under bright - field conditions, dislocation networks are observed. - **Microstructure under high - dose**: Under high - dose, white dots are caused not only by small dislocation loops but also by nanoscale strain fluctuations around the curved segments of dislocation lines. - **Formation of complex dislocation networks**: Isolated small dislocation loops are formed at low - dose, while complex dislocation networks are formed at high - dose, and these networks spontaneously align by reducing the elastic energy density. ### Conclusion By re - deriving the Howie - Whelan equation and using only atomic positions, the researchers successfully generated simulated TEM images of metallic materials under high - dose irradiation and compared them with experimental results. This method not only improves computational efficiency but also provides a new perspective for understanding the microstructural evolution of metallic materials under high - dose irradiation.