A Positional Misalignment Correction Method for Fourier Ptychographic Microscopy Based on the Quasi-Newton Method with a Global Optimization Module

Jinlei Zhang,Xiao Tao,Peng Sun,Zhenrong Zheng

DOI: https://doi.org/10.1016/j.optcom.2019.07.046

IF: 2.4

2019-01-01

Optics Communications

Abstract:Fourier ptychographic microscopy (FPM) can achieve high resolution imaging with a wide field-of-view, in which, the position of the LED sources determines the quality of the reconstructed image. In this paper, a positional misalignment correction method, which is based on the quasi-Newton method combined with a global optimization module, is proposed to recover a high quality and high-resolution image with positional error of the LED sources. In the method, the global optimization module optimizes the LED position at first, which gives the quasi-Newton method a better initial position estimate. Simulation and experiment have been performed to verify the effectiveness of the proposed method. The results show that, compared with state-of-the-art positional misalignment correction algorithms, the method achieves better reconstruction quality and makes the reconstruction process converge faster and more stable. The proposed method has also been proven to have great potential for correcting large random positional misalignment.