Aberration Correction Method For Fourier Ptychographic Microscopy Based On Neural Network

Jinlei Zhang,Xiao Tao,Chenning Tao,Peng Sun,Zhanghao Ding,Chang Wang,Zhenrong Zheng
DOI: https://doi.org/10.1117/12.2573583
2020-01-01
Abstract:Fourier ptychographic microscopy (FPM) is a recently developed computational imaging technology, which achieves high-resolution imaging with a wide filed-of-view by overcoming the limitation of the optical spatial-bandwidth-product (SBP). In the traditional FPM system, the aberration of the optical system is ignored, which may significantly degrade the reconstruction results. In this paper, we propose a novel FPM reconstruction method based on the forward neural network models with aberration correction, termed FNN-AC. Zernike polynomials are used to indicate the wavefront aberration in our method. Both the spectrum of the sample and coefficients of different Zernike modes are treated as the learnable weights in the trainable layers. The location of the LED and the captured low-resolution images are used as the input layers of the model, while the updated low-resolution complex wave are used as output layer. The loss function of the model is set as the difference between the updated complex wave and the original complex wave. By minimizing the loss function in the training process, the coefficients of different Zernike modes can be trained, which can be used to correct the aberration of the optical system. After the training process of the model, the high-resolution complex image can be obtained based on the trained spectrum of the sample. Simulation has been performed to verify the effectiveness of the proposed method.
What problem does this paper attempt to address?