Field Emission from a Periodic Amorphous Silicon Pillar Array Fabricated by Modified Nanosphere Lithography.

Wei Li,Jiang Zhou,Xian-gao Zhang,Jun Xu,Ling Xu,Weiming Zhao,Ping Sun,Fengqi Song,Jianguo Wan,Kunji Chen
DOI: https://doi.org/10.1088/0957-4484/19/13/135308
IF: 3.5
2008-01-01
Nanotechnology
Abstract:We prepare an array of amorphous silicon nanopillars by using a modified nanosphere lithography method. The fabrication process includes three steps: (1) 70 nm thick a-Si film was deposited on a crystalline silicon substrate; (2) the substrate was coated with a monolayer of polystyrene (PS) spheres to form an ordered structure on the a-Si thin film surface; (3) the sample was etched by reactive ion etching to produce the amorphous silicon pillar array. The results of field emission measurements show a low turn-on electrical field of about 4.5 V microm(-1) at a current density of 10 microA cm(-2). A relatively high current density exceeding 0.2 mA cm(-2) at 9 V microm(-1) was also obtained. The field enhancement factor is calculated to be about 1240 according to the Fowler-Nordheim (FN) relationship. The good field emission characteristics are attributed to the geometrical morphology, crystal structure and the high density of the field emitter of the silicon nanopillar.
What problem does this paper attempt to address?