Studies on the Propagation Losses of Silica Matrix Nanocomposite Films

MQ Wang,T Yang,LY Zhang,X Yao
DOI: https://doi.org/10.1080/00150199908214931
1999-01-01
Ferroelectrics
Abstract:Several TiO2-SiO2 nanocomposite films were prepared by Sol-Gel method. Waveguide losses for film samples were measured by an improved measurement system, which is based on the scattering light along the light direction on the film surface. The roughness and relevant length of the waveguide films were examined by Atomic Force Microscopy (AFM), which were found to be correlated to the surface losses. The body losses of waveguide was extracted from the total propagation losses. The present results are very useful for optimizing the preparation processes of films by Sol-gel.
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