Abstract:An accurate description of the electromagnetic properties of materials is fundamental to optical and electric devices. As a current research hotspot, thin slabs generally are modeled as a film of finite thickness with a dielectric function. However, inspired by two-dimensional materials, thin slabs can be regarded as surface current sheets with conductivity. Due to the convenience of the latter in simplifying the calculations, it becomes increasingly significant to determine the equivalent conditions of the two models. In this work, we compare the differences between the thin film and surface current models in calculating the transmissivity, reflectivity, and absorptivity of a SiC film. For normal incidence, the difference between the calculations of the two models is only non-negligible when the thickness is large (500 nm), because of the invalidation of surface current models and the excitation of Fabry-Perot resonance. In particular, we derive analytical formulas for the relative error in transmittance versus phase difference, which can be used to predict the difference between the two models as a function of film thickness. For oblique incidence, the two models have significant differences in the vicinity of epsilon-near-zero (ENZ) frequency. The excitation of the Berreman leaky mode in a thin film model causes a narrow blank absorption peak close to the ENZ frequency. However, we found that the surface current model is unable to form this resonance mode and further demonstrate it theoretically. In addition, it is found that the two models are equivalent in the case of a transverse electric wave even though the incidence is oblique. This work can enhance the awareness of the light-matter interaction and open unprecedented avenues for designing ultrathin optical devices.

Simple and Efficient Technique for Evaluating the Optical Losses from Surface Scattering and Volume Attenuation in a Thin Film.

Image Enhancement for Flat and Rough Film Plasmon Superlenses by Adding Loss

A New Method for Determination of the Optical Constants and Thickness of Thin Film

Rigorous analysis of the spatial dispersion effect in multilayer thin-film coatings.

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Spatial Dispersion of Optical Thin Films

Analysis Methods for Polarization State and Energy Transmission of Rays Propagating in Optical Systems

Comparative analysis of two models for the optical response of a thin slab: a film of finite thickness versus a surface current sheet

Determination of refractive indices and thickness of absorbing crystalline thin films by using prism coupler

Calculation and analysis of optical parameters of dielectric film by transmission spectrum measurement

The Research of a Method to Obtain the Optical Parameters of Semiconductor Films

An Ab Initio, Fully Coherent, Semi-Analytical Model of Surface-Roughness-Induced Scattering

Study of Ray Tracing Algorithm in the Scattering of Nano-particle Thin Films

A PRECISE AND SIMPLE METHOD, THE RELATIVE TRANSMISSION FRINGE DEPTH METHOD, OF DETERMINING THE OPTICAL-CONSTANTS AND THICKNESS OF THIN SEMITRANSPARENT FILMS

A Novel Technique for the Measurement of the Acoustic Properties of a Thin Linear-Viscoelastic Layer Using a Planar Ultrasonic Transducer

A novel scheme for simple and precise measurement of the complex refractive index and thickness of thin films

Attenuated total reflection method for measurements of optical properties of metallic films bordering anisotropic dielectrics

National air intelligence center effect of propagation attenuation of thin film waveguide on optical thin film losses . ii . experimental analysis

Extension of the Spectral Acceleration Method to Lossy Medium and Its Application to Electromagnetic Scattering from Rough Surfaces.

General Theory Of Optical Reflection From A Thin Film On A Solid And Its Application To Heteroepitaxy

Theoretical improvement and experimental design of prism coupler