Abstract:In this paper, a new method of calculating the diffraction efficiency for diffraction / refraction infrared hybrid system is given. By using this method, an automatic measurement system is designed. This system covers the wavelength range of 1 similar to 3 mu m, 3 similar to 5 mu m and 8 similar to 12 mu m. We use a blackbody as the energy source, put the lens which is to be measured above a computer controlled turntable in order to gain different results in different filed of view. We also have several relay lenses to cope with long or negative focal length. We use two types of detectors to deal with wavelength range of 1 similar to 3 mu m and 3 similar to 12 mu m. Both the detector and preamplifier are assembled together so we can easily change them for different wavelength ranges. To improve the accuracy of the measurements, a new theory of measuring the main energy is developed to minimize the negative impacts of other diffraction orders and the environment. We use an adjustable slit cooperating with a two-axis stage to scan the focal point and by adjusting the width of the slit we can reduce the energy of other diffraction orders and the environment that may come into our detector. During the experiment process we can manually control the slit and two-axis stage to improve the efficiency and use our computer program to improve the accuracy. The energy modulator and lock-in amplifier also help to improve the accuracy of our system. We designed two standard lenses for the 3 similar to 5 mu m wavelength range. Both of them are made of the same material, have the same focal length of 200mm and their shape is almost the same. The only difference between them is that one of them is pure refraction piece which acts as a reference and the other one has a diffraction surface to achromatic aberration. The result fits our theory well and the possible causes of the differences are discussed. This system has a practical meaning in the quality evaluating of infrared hybrid system.

Determination of refractive indices and thickness of absorbing crystalline thin films by using prism coupler

Analysis of Anisotropic Thin Film Parameters from Prism Coupler Measurements

Determination of the optical constants of polymer light-emitting diode films from single reflection measurements

Determination of Optical-Constants of Absorbing Crystalline Thin-Films from Reflectance and Transmittance Measurements with Oblique-Incidence

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

A New Method Of Calculating The Diffraction Efficiency For Diffraction/Refraction Infrared Hybrid System

Diffraction and External Reflection by Dielectric Faceted Particles

Anisotropic Optical Constants Of In-Plane Oriented Polyfluorene Thin Films On Rubbed Substrate

Attenuated total reflection method for measurements of optical properties of metallic films bordering anisotropic dielectrics

Determination of the Optical-Constants and Thickness of A Highly Absorbing Film Using the Attenuated Total Reflection Technique

A New Method for Determination of the Optical Constants and Thickness of Thin Film

Reflection/transmission Measurements of Anisotropic Films with One of the Principal Axes in the Direction of Columnar Growth

Theoretical improvement and experimental design of prism coupler

A Research of Thickness Measurement of Nano-Porous Alumina Films Based on Reflection Spectrum

Simple and Efficient Technique for Evaluating the Optical Losses from Surface Scattering and Volume Attenuation in a Thin Film.

Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference

A novel scheme for simple and precise measurement of the complex refractive index and thickness of thin films

Determination of the Optical Constants of Solar-Control Amorphous Silicon Thin Films on Float Glass

Determination of complex refractive index using prism composed of absorbing medium

Guided waves in thin films consisting of tilted columns deposited on anisotropic substrates: excited by a birefringent coupler

Numerical and Experimental Analysis of a Focused Reflected Wave in a Multi-Layered Material Based on a Ray Model.