The preparation of silica-based SiO2-ZrO2 films as waveguides by sol-gel process

Deliang Su,Guodong Qian,Zhiyu Wang,Zhanglian Hong,Mingquan Wang
DOI: https://doi.org/10.3321/j.issn:1002-185x.2004.z1.074
2004-01-01
Rare Metal Materials and Engineering
Abstract:ZrO2-SiO2 gel glass planar waveguides with various Zr contents were prepared by the low temperature sol-gel method with zirconium (IV)-propoxide stabilized with acetic acid and pre-hydrolyzed tetraethyl-orthosilicate (TEOS) as precursors. The films were deposited by spin-coating on silicon substrates. The films FTIR measurements were carried out. The refraction of the gels and films also were studied. It is found that the refractive index of mixed oxide gel glass with X-Zx <= 20% is linear with the Zr contents. By employing FTIR techniques, a new Zr-O-Si bond has been investigated with part of the zirconium ions being incorporated into the silica network. The refractive index of the blend sample can be turned with Zr contents. When the content of Zr is more than 20%, the zirconium (IV)-propoxide stabilized with acetic acid hydrolyzed incomplete. The existence of such complex resulted in lots of crackles in the films and the refraction index of mixed oxide gel glass and films non-linear with the Zr contents. The law of how to control the films thickness in spin-coating procedure was also studied.
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