Deep centers inAlGaAs/GaAs GRIN-SCHSQW laser structures grown by MBE and MOCVD

Liwu Lu,Songlin Feng,Junying Xu,Hui Yang,Zhanguo Wang,J. Wang,Y. Wang,Weikun Ge
DOI: https://doi.org/10.1016/S0022-0248(97)80005-X
IF: 1.8
1996-01-01
Journal of Crystal Growth
Abstract:The deep centers inAlGaAs/GaAs graded index-separate confinement heterostructure single quantum well (GRIN-SCHSQW) laser structures grown by MBE and MOCVD have been investigated using deep level transient spectroscopy (DLTS) technique. The majority and minority carrier DLTS spectra show that the deep (hole and electron) traps (H1 and E3), having large capture cross sections and concentrations, are observed in the gradedn-AlxGa1 − xAs layer of laser structures in addition to the well-known DX centers. For laser structures grown by MBE, the deep hole trap H1 and the deep electron trap E3 may be spatially localized in the interface regions of discontinuous variation Al mole fraction of then-AlxGa1 − xAs layer with x = 0.20−0.43. For laser structures grown by MOCVD, the deep electron trap E3 may be spatially localized in then-AlxGa1 − xAs layer with x = 0.18−0.30, and the DX center may be spatially localized in the interface regions of discontinuous variation Al mole fraction of theAlxGa1 − xAs layer with x = 0.22−0.30.
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