EFFECT OF FILM THICKNESS TOWARDS THE RECTIFYING PROPERTIES AND MAGNETORESISTANCE OF La_(0.67)Ca_(0.33)MnO_3/Nb-SrTiO_3 p~n JUNCTIONS

Yang Bin,Lang Pei-lin,Xiong CHang-min,ZHao Yong-gang
2007-01-01
Abstract:The p~n junctions were fabricated by developing La0.67Ca0.33MnO3 thin films with thicknesses of 5 nm and 50 nm respectively on Nb-1wt%:SrTiO3 through the method of using pulsed laser deposition. The current-voltage (I~V) measurements show that the sample with 50 nm thick film displays a good rectifying property, and no changes were observed under an applied magnetic field of 1T. But the rectifying property of the sample with 5 nm thick film nearly disappeared under low temperature and the electrical characteristics can be remarkably influenced by applied 1T magnetic field. The magnetoresistance of the sample with 5 nm thick film can reached about -30% at 30K. The results were explained by considering the thicknesses of both the film and the depletion layer in the p~n junctions.
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