Physical properties of Cu/La<sub>0.67</sub>Ba<sub>0.33</sub>MnO<sub>3</sub>/SrTiO<sub>3</sub> : Nb junctions with ultrathin manganite layers

Weiwei Gao,Xuan Sun,Baogen Shen,Jirong Sun
DOI: https://doi.org/10.1088/0022-3727/44/2/025002
2010-01-01
Abstract:We performed a systematic study on a Cu/La0.67Ba0.33MnO3/SrTiO3 : Nb (Cu/LBMO/STON) junction with a manganite layer, a few unit cells in width, focusing on the evolution of Cu–STON coupling as the film thickness of LBMO grew. The physical properties of the junction are found to be jointly determined by the electrode, the film and the substrate when the film thickness of LBMO is below ∼1 nm, with a carrier tunnelling process and a weakly rectifying feature. A LBMO film above ∼1 nm completely screens the electrode–substrate interaction, enhancing the rectifying character of the junctions significantly. A further increase in film thickness leads only to a minor modification of the junctions.
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