Annealing Effects on the Size of Si-nanocrystals Embedded in Bulk SiO

Weiwei Ke,Xue Feng,Yidong Huang
DOI: https://doi.org/10.1016/j.jcrysgro.2010.12.073
IF: 1.8
2011-01-01
Journal of Crystal Growth
Abstract:In the process of synthesizing Si-nanocrystals (Si-nc) from bulk SiO, the relationship between Si-nc size distribution and annealing condition (temperature from 800 to 1150°C and time from 1 to 16h) is experimentally investigated by X-ray diffraction and high resolution transmission electron microscopy. It is found that the average size of Si-ncs can be tuned through annealing condition from less than 3nm to ∼10nm, while the size distribution follows a lognormal function with an almost unchanged standard deviation of 0.2. After annealing at even higher temperature (1150°C), two groups of Si-ncs with very different average sizes exist simultaneously and a double lognormal function should be applied to describe the size distribution.
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