Rectifying Properties of Solid C-60/N-Gan, C-70/N-Gan and C-70/P-Gan Heterojunctions

WH Sun,KM Chen,K Wu,CY Li,QL Zhang,XH Zhou,ZN Gu,GG Qin
DOI: https://doi.org/10.1016/s0038-1101(99)00296-8
IF: 1.916
2000-01-01
Solid-State Electronics
Abstract:Current-voltage measurements show that C-60/n-GaN, C-70/n-GaN and C-70/p-GaN contacts have very good rectification characteristics, however, the polarities of the forward biases for C-60/n-GaN (C-70/n-GaN) and C-70/p-GaN are opposite to each other. By fitting forward current-voltage data, the relations of both the series resistance and ideality factor vs forward bias for C-60/n-GaN and C-70/n-GaN have been obtained. Thermal activation measurements at a fixed forward bias reveal exponential relations of currents vs the reciprocal of temperature. The effective barrier heights for C-60/n-GaN and C-70/n-GaN are determined to be 0.535 and 0.431 eV, respectively. (C) 2000 Elsevier Science Ltd. All rights reserved.
What problem does this paper attempt to address?