Abstract:Exploring the electronic levels of polarons in organic semiconductors is key to understanding charge transport. This study investigates the prototypical small‐molecule semiconductor C60, using direct and inverse photoemission spectroscopy to probe the density of states in n‐doped films. The Coulomb interaction energy (Hubbard U) of the C60 anion is experimentally determined to be ≈1.1 eV, consistent with theoretical predictions. Determining the electronic levels associated with polarons, the fundamental charge carriers in organic semiconductors, is key to understanding the charge transport properties of these materials. Recent findings challenge the traditional view of these electronic levels by highlighting the importance of intra‐molecular Coulomb interactions in polarons. Experimental evidence was previously presented for a revised model of the negative polaron in the case of the polymer semiconductor poly(NDI2OD‐T2); there, the addition of an excess electron was seen to lead to the emergence of a singly occupied state within the energy gap of the undoped material and an unoccupied state above the edge of the conduction states. Here, focus is on a small‐molecule semiconductor, C60, and spectral evidence is provided of a similar picture for the new states appearing upon polaron formation. Specifically, direct and inverse photoemission spectroscopy is used to investigate the density of states in C60 films n‐doped with two dimeric dopants. The Coulomb interaction energy (Hubbard U) of the C60 anion is experimentally determined to be ≈1.1 eV, a value that aligns closely with theoretical predictions.

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