Abstract:Memory circuits have become important components in today's IC designs which demands extremely high integration density and reliability under process variations. The most challenging task is how to accurately estimate the extremely small failure probability of memory circuits where the circuit failure is a "rare event". Classic importance sampling has been widely recognized to be inaccurate and unreliable in high dimensions. To address this issue, we propose a fast statistical analysis to estimate the probability of rare events in high dimensions and prove that the estimation is always bounded. This methodology has been successfully applied to the failure analysis of memory circuits with hundreds of variables, which was considered to be very intractable before. To the best of our knowledge, this is the first work that successfully solves high dimensional "rare event" problems without using expensive Monte Carlo and classic importance sampling methods. Experiments on a 54-dimensional SRAM cell circuit show that the proposed approach achieves 1150x speedup over Monte Carlo without compromising any accuracy. It also outperforms the classification based method (e.g., Statistical Blockade) by 204x and existing importance sampling method (e.g., Spherical Sampling) by 5x. On another 117-dimension circuit, the proposed approach yields 364x speedup over Monte Carlo while existing importance sampling methods completely fail to provide reasonable accuracy.

Importance Boundary Sampling for SRAM Yield Analysis with Multiple Failure Regions

High-Dimensional and Multiple-Failure-Region Importance Sampling for Sram Yield Analysis

An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis

MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS

Efficient SRAM yield optimization with mixture surrogate modeling

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

Efficient Importance Sampling for High-Sigma Yield Analysis with Adaptive Online Surrogate Modeling

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

Rapid Estimation of the Probability of SRAM Failure Via Adaptive Multi-Level Sliding-Window Statistical Method.

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation.

Cache RAM inductive fault analysis with fab defect modeling

A Fast and Provably Bounded Failure Analysis of Memory Circuits in High Dimensions.

A New Via Chain Design Method Considering Confidence Level and Estimation Precision

Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage

A systematic design methodology for yield-driven near-threshold SRAM design

Yield Driven Design and Optimization for Near Threshold Voltage Sram Cells

An Efficient Optimization Based Method to Evaluate the DRV of SRAM Cells

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits

Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation with Both High Accuracy and Efficiency