Abstract:Statistical analysis of SRAM has emerged as a challenging issue because the SRAM cell failure probability is extremely small. In this paper, we develop a novel efficient sampling, searching and estimating method to capture the probability of SRAM failure. Particularly, we propose an innovative Adaptive Multi-Level Sliding-Window (AMLSW) method to find the failure boundary in the parameter space with less computational cost. The proposed AMLSW method applies an integrated optimization engine to adaptively explore the failure boundary by sampling a sequence of parameter points and calculating the simulation result in sliding windows. Its key features include ellipsoid transformation, multi-level grid partition and sliding window algorithm to make our method efficient and accurate for finding the SRAM failure probability and failure boundary in parameter space. Furthermore, we provide theoretical analysis on our new AMLSW method. The experimental results of a commercial 65 nm SRAM cell demonstrate that the AMLSW method achieves 1.7-40 x runtime speed-up over the existing methods without surrendering accuracy, and dramatically high speed-up over normal M-C sampling method. Moreover, this new method provides the failure boundary in the parameter space as shown in experiments. (C) 2015 Elsevier B.V. All rights reserved.

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

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Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

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MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS

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Importance Boundary Sampling for SRAM Yield Analysis with Multiple Failure Regions

Efficient Yield Optimization for Analog and SRAM Circuits Via Gaussian Process Regression and Adaptive Yield Estimation

Nonlinear Quantization for In-Sram Multi-Bit MAC Design

Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation with Both High Accuracy and Efficiency

High-Dimensional Yield Estimation using Shrinkage Deep Features and Maximization of Integral Entropy Reduction

High-Dimensional and Multiple-Failure-Region Importance Sampling for Sram Yield Analysis

Bmf-Bd: Bayesian Model Fusion On Bernoulli Distribution For Efficient Yield Estimation Of Integrated Circuits

Rapid Estimation of the Probability of SRAM Failure Via Adaptive Multi-Level Sliding-Window Statistical Method.

Yield Driven Design and Optimization for Near Threshold Voltage Sram Cells

Multi-Corner Parametric Yield Estimation Via Bayesian Inference on Bernoulli Distribution with Conjugate Prior.

Efficient Importance Sampling for High-Sigma Yield Analysis with Adaptive Online Surrogate Modeling

Bayesian Inference on Introduced General Region