Abstract:The reliability of circuits is significantly affected by process variations in manufacturing and environmental variation during operation. Current yield optimization algorithms take process variations into consideration to improve circuit reliability. However, the influence of environmental variations (e.g., voltage and temperature variations) is often ignored in current methods because of the high computational cost. In this article, a novel and efficient approach named BNN-BYO is proposed to optimize the yield of analog circuits in multiple environmental corners. First, we use a Bayesian Neural Network (BNN) to simultaneously model the yields and performances of interest in multiple corners efficiently. Next, the multi-corner yield optimization can be performed by embedding BNN into a Bayesian optimization framework. Since the correlation among yields and performances of interest in different corners is implicitly encoded in the BNN model, it provides great modeling capabilities for yields and their uncertainties to improve the efficiency of yield optimization. Our experimental results demonstrate that the proposed method can save up to 45.3% of simulation cost compared to other baseline methods to achieve the same target yield. In addition, for the same simulation cost, our proposed method can find better design points with 3.2% yield improvement.

Multi-Corner Parametric Yield Estimation Via Bayesian Inference on Bernoulli Distribution with Conjugate Prior.

Efficient Parametric Yield Estimation over Multiple Process Corners Via Bayesian Inference Based on Bernoulli Distribution

Design Time Body Bias Selection for Parametric Yield Improvement.

Yield Optimization for Analog Circuits over Multiple Corners Via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation

Bmf-Bd: Bayesian Model Fusion On Bernoulli Distribution For Efficient Yield Estimation Of Integrated Circuits

Bayesian Inference on Introduced General Region

C-Yes: an Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations

Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits

Efficient Rare Failure Analysis over Multiple Corners Via Correlated Bayesian Inference

Approximating Probability Distribution of Circuit Performance Function for Parametric Yield Estimation Using Transferable Belief Model

Efficient Multivariate Moment Estimation Via Bayesian Model Fusion For Analog And Mixed-Signal Circuits

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

Efficient Yield Optimization for Analog and SRAM Circuits Via Gaussian Process Regression and Adaptive Yield Estimation

Quickyield: An Efficient Global-Search Based Parametric Yield Estimation With Performance Constraints

Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits over Multiple Corners

An Efficient Yield Optimization Method for Analog Circuits Via Gaussian Process Classification and Varying-Sigma Sampling

Bayesian Optimization Approach for Analog Circuit Design Using Multi-Task Gaussian Process

Parametric Yield Optimization Based on RSM and Uniform Experiment Design

Efficient Performance Modeling Via Dual-Prior Bayesian Model Fusion for Analog and Mixed-Signal Circuits

A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm