Abstract:The multi-mode system failure probability function (SFPF) can quantify how the distribution parameters of the random input vector affect the system safety and decouple the system reliability-based design optimization model. However, for a problem with a time-consuming implicit performance function and rare failure domain, efficiently solving the SFPF remains significantly challenging. Therefore, in this study, two efficient algorithms are proposed, namely, the meta model-based importance sampling and cross entropy-based importance sampling. The contributions of this study are twofold. The first is constructing a single-loop optimal importance sampling density (SL-OISD) method to decouple the double-loop framework for analyzing the SFPF. The second is establishing two methods to efficiently approximate the SL-OISD and complete the SFPF estimation. The first method is based on the meta model of the system performance function, which is abbreviated as SL-Meta-IS. The second method is based on minimizing the cross entropy between the Gaussian mixture density model and SL-OISD, which is abbreviated as SL-CE-IS. To reduce the number of evaluating the system performance function when approximating the SL-OISD, sampling the SL-OISD, and identifying the state of the samples for completing the SFPF estimation, an adaptive Kriging model of the system performance function is introduced into SL-Meta-IS and SL-CE-IS. Owing to decoupling the double-loop framework into a single-loop framework, replacing the time-consuming system performance function with the economic Kriging model, and employing importance sampling variance reduction techniques to address issues related to the rare failure domain, the proposed SL-Meta-IS and SL-CE-IS methods greatly enhance the efficiency of SFPF estimations. The numerical and practical examples demonstrate that the two proposed methods are superior to the existing algorithms; moreover, the efficiency of SL-CE-IS is higher than that of SL-Meta-IS.

High-Dimensional and Multiple-Failure-Region Importance Sampling for Sram Yield Analysis

Importance Boundary Sampling for SRAM Yield Analysis with Multiple Failure Regions

An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis

MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

Rapid Estimation of the Probability of SRAM Failure Via Adaptive Multi-Level Sliding-Window Statistical Method.

A Fast and Provably Bounded Failure Analysis of Memory Circuits in High Dimensions.

Efficient Importance Sampling for High-Sigma Yield Analysis with Adaptive Online Surrogate Modeling

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation.

Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

Efficient SRAM yield optimization with mixture surrogate modeling

An Efficient Optimization Based Method to Evaluate the DRV of SRAM Cells

Accurate Estimation of SRAM Dynamic Stability

Fast Statistical Analysis of Rare Failure Events with Truncated Normal Distribution in High-Dimensional Variation Space

Improving Importance Sampling Method in Structural Reliability

Beyond the Yield Barrier: Variational Importance Sampling Yield Analysis

Meta model-based and cross entropy-based importance sampling algorithms for efficiently solving system failure probability function

Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation with Both High Accuracy and Efficiency

Rare event estimation with sequential directional importance sampling (SDIS)