Abstract:Using the spin-transfer torque random access memory (STT-RAM) technology as lower level on-chip caches has been proposed to minimize leakage power consumption and enhance cache capacity at the scaled technologies. However, programming STT-RAM is a stochastic process due to the random thermal fluctuations. Conventional worst-case (corner) design with a fixed write pulse period cannot completely eliminate the write failures but maintain it at a low level by paying high cost in hardware complexity and system performance. In this work, we systematically study the impacts of the stochastic switching of STT-RAM on circuit and cache performance. Two probabilistic design techniques, write-verify-rewrite with adaptive period (WRAP) and verify-one-while-writing (VOW), then are proposed for performance improvement and write failure reduction. Our simulation results show that compared to the result of the conventional design using Hamming Code to correct the write failures, WRAP is write error free while reducing the cache write latency and energy consumption by 40% and 26%, respectively. When an extremely low write failure rate (i.e., 1022) is allowed, VOW can further boost the reductions on write latency and energy to 52% and 29%, respectively. Furthermore, a hybrid STT-RAM based cache hierarchy taking advantages of probabilistic design techniques is proposed. The novel hierarchy can reduce the write failure rate of STT-RAM cache to 1030, while improving the speed by 6.8% and saving 15% of energy consumption compared to a conventional design with Hamming Code.

A Fast and Provably Bounded Failure Analysis of Memory Circuits in High Dimensions.

Modeling and Benchmarking Computing-in-Memory for Design Space Exploration.

MAXIMUM LIKELIHOOD ESTIMATION FOR FAILURE ANALYSIS OF SRAM CELLS USING INDUCTIVE FAULT ANALYSIS

High-Dimensional and Multiple-Failure-Region Importance Sampling for Sram Yield Analysis

Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage

Rapid Estimation of the Probability of SRAM Failure Via Adaptive Multi-Level Sliding-Window Statistical Method.

Importance Boundary Sampling for SRAM Yield Analysis with Multiple Failure Regions

Correlated Rare Failure Analysis Via Asymptotic Probability Evaluation

Efficient Importance Sampling for High-Sigma Yield Analysis with Adaptive Online Surrogate Modeling

Fast Statistical Analysis of Rare Failure Events with Truncated Normal Distribution in High-Dimensional Variation Space

Efficient Rare Failure Analysis over Multiple Corners Via Correlated Bayesian Inference

Probabilistic Compute-in-Memory Design For Efficient Markov Chain Monte Carlo Sampling

An Efficient and Robust Yield Optimization Method for High-dimensional SRAM Circuits.

An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis

An Efficient Bayesian Yield Estimation Method for High Dimensional and High Sigma SRAM Circuits.

Accurate Estimation of SRAM Dynamic Stability

Fast and Accurate Statistical Simulation of Shared-Memory Applications on Multicore Systems

A unified architecture for speed-binning and circuit failure prediction and detection

An Efficient SRAM Yield Analysis and Optimization Method with Adaptive Online Surrogate Modeling

Cross-entropy-based importance sampling with failure-informed dimension reduction for rare event simulation

Probabilistic design methodology to improve run-time stability and performance of STT-RAM caches