A unified architecture for speed-binning and circuit failure prediction and detection

songwei pei,zhaolin li,huawei li,xiaowei li,shaojun wei
DOI: https://doi.org/10.1109/CSAE.2012.6272805
2012-01-01
Abstract:With the continual scaling of semiconductor process technology, the circuit timing is increasingly impacted by process variations. It is thus important to categorize high-speed digital circuits into multiple bins of different performances. However, the speed-binning process typically needs very long test application time. In this paper, we proposed a unified architecture, which can accomplish performance grading with a high confidence and short test application time. Moreover, the proposed architecture can be used for on-line circuit failure prediction and detection. Experimental results are presented to validate the proposed architecture.
What problem does this paper attempt to address?