Abstract:Process variations during manufacturing lead to differences in the performance of the chips. In order to better utilize the performance of the chips, it is necessary to perform maximum operation frequency (Fmax) tests to place the chips into different speed bins. For most Fmax tests, significant efforts are put in place to reduce test cost and improve binning accuracy; e.g., our conference paper published in ICICM 2017 presents a novel binning sensor for low-cost and accurate speed binning. However, by promoting chips placed at the lower bins, because of conservative binning, into higher bins, the overall profit can greatly increase. Therefore, this paper, extended based on a conference paper, presents a novel and adaptive methodology for speed binning, in which the paths impacting the speed bin of a specific IC are identified and adapted by our proposed on-chip Binning Checker and Binning Adaptor. As a result, some parts at a bin margin can be promoted to higher bins. The proposed methodology can be used to optimize the Fmax yield of a digital circuit when it has redundant timing in clock tree, and it can be integrated into current Fmax tests with low extra cost. The proposed adaptive system has been implemented and validated on five benchmarks from ITC, ISCAS89, and OpenSPARCT2 core on 28 nm Altera FPGAs. Measurement results show that the number of higher bin chips is improved by 7-16%, and our cost analysis shows that the profit increase is between 1.18% and 3.04%.

Statistical Framework and Built-In Self-Speed-Binning System for Speed Binning Using On-Chip Ring Oscillators.

On-Chip Structures for Fmax Binning and Optimization

1-Bit Compressed Sensing Based Framework For Built-In Resonance Frequency Prediction Using On-Chip Noise Sensors

Bandwidth-Related Optimization in High-Speed Frequency Dividers Using Sige Technology

A Self-Calibration Technique for On-Chip Precise Clock Generator

Fast Machine-Learning-Driven Supply Noise-Aware Macromodeling for High-Speed Nonlinear Drivers

A Calibration Scheme for a 800-Ms/s 14 Bit Pipelined ADC in 28-Nm CMOS

Multi-core Chip Dynamic Power Management Framework Based on Reinforcement Learning br

A Statistical Framework for Post-Fabrication Oxide Breakdown Reliability Prediction and Management

A unified architecture for speed-binning and circuit failure prediction and detection

Design And Automatic Generation Of Area-Efficient Ring Oscillator Based Addressable Test Chips

THE IMPLEMENT OF SPEED ESTIMATION CORE BASED ON MRAS ALGORITHM

Fully on-chip clock jitter and skew measurement scheme via incoherent subsampling

A High-Throughput, High-Accuracy System-Level Simulation Framework for System on Chips

Speedup Factor Estimation Through Dynamic Behavior Analysis For Fpga

Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing

Statistical Methodology to Identify Optimal Placement of On-Chip Process Monitors for Predicting Fmax

A Compact Pico-Second In-Situ Sensor Using Programmable Ring Oscillators For Advanced On Chip Variation Characterization In 28nm Hkmg

At-Speed Logic BIST for IP Cores

Fast Statistical Timing Analysis for Circuits with Post-Silicon Tunable Clock Buffers

A Novel Memory Subsystem Evaluation Framework for Chip Multiprocessors.