Nanocomposite-Like Structure in an Epitaxial Cacu3ti4o12 Film on Laalo3(001)

JC Jiang,EI Meletis,CL Chen,Y Lin,Z Zhang,WK Chu
DOI: https://doi.org/10.1080/09500830410001726996
IF: 1.195
2004-01-01
Philosophical Magazine Letters
Abstract:We report the detailed microstructural study of a CaCu3Ti4O12 (CCTO) thin film using transmission electron microscopy (TEM). The CCTO thin film studied in this work was deposited on a (001)-oriented LaAlO3 (LAO) substrate by pulsed-laser ablation and has a high dielectric constant of about 10(4) at 1 MHz at room temperature; however, the mechanism for such a dielectric property is not yet understood. Plan-view TEM studies show that the CCTO samples have orthogonal domain structures with the edge nearly parallel to either the [100] or the [010] direction of the CCTO. A minor anatase TiO2 phase was found at the domain boundaries. The CCTO and the TiO2 phases are separated by an amorphous-like layer that has a thickness of several nanometres. Cross-sectional TEM studies reveal that both CCTO and TiO2 in the films are c axis oriented with a very sharp interface to the LAO-(001) substrate and possess a unique crystallographic orientation relationship of (001)(CCTO)//(001)(TiO2)//(001)(LAO) and [100](CCTO)//[100](TiO2)//[100](LAO). The Rutherford back-scattering ion chanelling studies suggest a composition of Ca1.5Cu3Ti5.5O16 for the film, in which the extra calcium, titanium and oxygen form the anatase TiO2 phase and amorphous calcium oxide layer that separates the CCTO and TiO2 phases. Such nanocomposite-like structures may provide an important clue to the mechanism of the dielectric property of these films.
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