Investigation on the dielectric properties of CaCu3TixO12

TongWen Xu,Jianying Li,Shengtao Li,QiFeng Huang
2008-01-01
Abstract:Investigation on the dielectric properties of CCTO was carried out when Ti stoichiometry was altered in the range of 3.5 to 4.5.For x=3.5, it was found through XRD that besides primary CCTO phase, there were also CuO and CaTiO3 phases. For x=4.5, additional TiO2 was found besides dominating CCTO phase. When x increases from 3.5 to 4.5, it was found that dielectric constant decreased, varistor voltage and nonlinear coefficient increased while the dielectric loss decreased. According to IBLC theory, it was suggested that the change of the grain boundary structure resulted in different barrier height and insulating state when x changed.
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