Abstract:In the field of materials science, Electron Backscatter Diffraction (EBSD) technology has become a powerful tool for microstructure analysis, demonstrating unique advantages in the study of material texture, grain size, and orientation distribution. Recognizing that the quality of EBSD sample preparation directly impacts the accuracy and reliability of data, this paper delves into the principles of EBSD technology and explores optimized methodologies for sample preparation. By examining the influence of different preparation techniques on EBSD data quality, this study systematically summarizes best practices for critical steps such as surface treatment, polishing, and electrolytic polishing. The research reveals that meticulous sample preparation significantly enhances the quality of EBSD images, thereby improving the resolution and precision of diffraction data. Additionally, addressing the challenges and limitations encountered in practical applications of EBSD technology, a series of improvement measures are proposed to facilitate the widespread application of EBSD in materials science. In summary, this paper aims to provide researchers with a comprehensive EBSD sample preparation guideline, fostering advanced research and practical applications in the field of material analysis.

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